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CMOS X-ray detectors geared for non-destructive testing

Posted: 06 Jul 2015     Print Version  Bookmark and Share

Keywords:Teledyne  non-destructive testing  scientific imaging  X-ray detector  CMOS 

Teledyne DALSA, a Teledyne Technologies company, has unleashed its Rad-icon 2022 CMOS X-ray detector. According to the company, the detector features 2064 x 2236 pixel resolution, an active area of 20.4cm x 22.1cm and 99µm pixel size. Rad-icon detectors deliver real-time imaging of up to 30fps, high sensitivity and superb resolution in a large area device that is fully integrated and available with a fast, reliable Gigabit Ethernet or camera link interface, detailed Teledyne.

Rad-icon 2022

This unique combination of high resolution and fast imaging make Rad-icon detectors ideal for industrial X-ray inspection, scientific imaging and non-destructive testing, including weld inspection, wire bond and PCB inspection, microfocus systems, CT and other demanding industrial imaging applications.

Rad-icon digital x-ray detectors leverage Teledyne DALSA's advanced CMOS image sensing technology and enable the delivery of higher image quality than a-Si flat panels and image intensifier devices.

Other features of the product include: 5lp/mm resolution; energy range from 10kV to 225kV, 14bit digitisation of images, and SDKs, drivers and programming support.

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