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GENASYS platform to test satellite systems, subsystems

Posted: 29 Jan 2015     Print Version  Bookmark and Share

Keywords:TS-323 Genasys Test Platform  satellite subsystem 

Marvin Test Solutions announced the delivery of its TS-323 GENASYS Test Platform to Lockheed Martin Space Systems Company (LMSSC) for the testing of its satellite systems and subsystems. GENASYS is a PXI-based system designed to meet the demands of applications that require performance testing. It features a multiplexed switching subsystem with any-pin-to-any-resource architecture and switch management software that provides automated, end-to-end signal routing. The test platform also includes a digital subsystem that supports up to 51I/O pins with multiple timing sets and per-pin PMU capability.

"As aerospace systems become more complex, engineers must have increasingly flexible and capable test equipment to ensure accuracy, reliability and safety of mission-critical systems. The lack of available OEM support for legacy ATE systems compels users to either replace or upgrade legacy ATE systems, and both of these decisions are typically expensive, difficult and often don't yield the needed results," said Major General Steve Sargeant, USAF (Ret.), CEO of Marvin Test Solutions.

"We created the GENASYS platform and added this new switching subsystem to solve that problem. With a compact footprint, open, expandable architecture and SwitchEasy software, the GENASYS platform eases the burden on test engineers, becoming a replacement for obsolete legacy digital functional test systems from manufacturers including Teradyne, Schlumberger, and GenRad. The platform also can form the basis for a completely new system that will address next-generation, complex testing challenges and manage up to 4,500 interface test points without manual programming."

Lockheed Martin's test requirements for future applications include an open architecture; a test platform that is configurable, scalable and the capability to support more than 4,000I/O test points; as well as offering performance digital and analogue test capabilities. The GENASYS platform, with its digital subsystem and switching subsystem, provides LMSSC the required functionality to support both their legacy and future test needs.

The GENASYS platform now features the GX7016, a modular switching subsystem with SwitchEasy software for easy use and testing of complex, high I/O count and mixed-signal applications including those for complex electronic systems. With SwitchEasy software, test engineers no longer have to manually route individual signals, and can automatically and efficiently monitor relays. Also, to support legacy test requirements, GENASYS includes software tools that test engineers can use to migrate existing applications to the platform. The platform offers test engineers advanced software tools with system and UUT simulation capabilities, and user-defined FPGA instrumentation for the support of custom control interfaces.

The PXI digital subsystem addresses a range of bus test requirements including 1553, 429, RS-232, and custom or parallel digital busses. In addition, the multiplexed pin architecture of the GENASYS platform supports more than 6,000UUT pin connections. With hybrid pin capability, both analogue and digital tests can be performed at the pin level.

The GENASYS platform is ideal for mission-critical electronics applications–whether at the board, box, or system level–including satellite payloads, platform management systems, armament electronics and subsystems, and flight management and control systems.

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