Advantest boosts T2000 tester with PMU32E module
Keywords:PMU modules SoC on-die regulators
Advantest Corporation has enhanced its T2000 portfolio with the latest multipurpose parametric measurement unit (PMU) module, the T2000 PMU32E.
Suited for testing digital, analogue and power management system-on-chip (SoC) devices, the 32-channel module offers high density and increased resolution and accuracy.The PMU32E is compatible with Advantest's PMU32 module as it uses the same tester interface unit (TIU).
"By using our new PMU module with its built-in performance improvements, our customers can gain the functionality of an EPP tester at a lower capital investment," said Dr. Toshiyuki Okayasu, executive officer and executive vice president, SoC Test Business Group at Advantest Corporation.
With the T2000 PMU32E, the measurement time is more than two times faster than with the earlier module. In particular, DC linearity measurement time is much faster due to an enhanced sampling rate and enhanced data transfer. These faster operating speeds lead to higher throughputs and a lower overall cost of test.
Operating efficiency is further improved by the module's ability to run test programmes already developed for the earlier PMU32 module. In addition, the module features twice as much memory capacity, expanding the capabilities of the channel-independent arbitrary waveform generator (AWG) and digitiser.
The PMU32E also supports load testing of on-die regulators (ODR) with its ISVM (current source and voltage measurement) ganging function.
Advantest expects to begin shipping PMU32E modules to customers by the first quarter of 2015.
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