Single event upset report for ADC

This report summarizes the Single Event Effects (SEE) testing performed on the Texas Instruments ADS5474 using the 15 MeV/u beam line from the Texas A&M University (TAMU) 88-inch Cyclotron on two separate visits on April 8th and June 27th, 2013. Both SEL and SEU characterization was performed using an ion cocktail consisting of ions with Linear Energy Transfer (LET) in a range of 18.7MeV/cm2/mg up to 87MeV/cm2/mg. Multiple devices were utilized for this testing. LET values reported are derived from TAMU provided data and calculated at die surface through 40mm air gap.

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Originally published by Texas Instruments Inc. at www.ti.com as "Single Event Upset Report: Single channel 14bit 400MSPS Analog to Digital Converter".