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Agilent outs improved device modelling, characterisation tool

Posted: 24 Jun 2014     Print Version  Bookmark and Share

Keywords:Agilent Technologies  device modelling  characterisation  EDA  FinFET 

Agilent Technologies Inc. has introduced a number of innovations for the latest release of its suite of device modelling and characterisation software tools. The suite includes Agilent EEs of EDA's Integrated Circuits Characterisation and Analysis Program (IC-CAP), Model Builder Program (MBP) and Model Quality Assurance (MQA).

The software release features three advanced device modelling packages for Agilent's DynaFET, BSIM6 and BSIM-CMG models.

BSIM6 is the industry-standard model for bulk MOSFETs, offering important improvements for analogue/RF applications over its predecessor, BSIM4. BSIM-CMG is the industry-standard model for sub-20nm 3D FinFET technologies. Modelling solutions for both BSIM6 and BSIM-CMG in the 2014 release are designed to help the semiconductor industry understand and use these technologies.

The DynaFET modelling package is based on internally developed technology and is an integral part of Agilent's GaN HEMT characterisation, modelling and simulation solution. The GaN HEMT modelling package provides a GUI-based turnkey solution for DynaFET model generation.

Using artificial neural networks for charge and current formulations, and incorporating trapping/de-trapping and self-heating effects, the time-domain DynaFET model is capable of fitting accurately to DC, linear and large-signal measurement data-all simultaneously. This allows a single model file to be used for the design of different applications under various bias conditions, all with accurate simulation results.

The 2014 device modelling and characterisation software release also provides a number of new and enhanced features designed to noticeably improve productivity across the end-to-end work flow of device characterisation, model generation and model validation. These enhancements include a programming editor, faster simulation speed with major simulators, expanded mismatch and variation modelling solutions, and a streamlined and flexible user interface to create, manage, monitor and debug measurement test plans.

Agilent's 2014 device modelling and characterization software release will be available in July.





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