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Oscilloscopes support IBIS-AMI, S-parameters modelling

Posted: 17 Apr 2014     Print Version  Bookmark and Share

Keywords:Tektronix  IBIS-AMI  S-parameter  oscilloscope  on-chip silicon 

Tektronix Inc. has expanded the capabilities of the analysis system on its MSO/DPO70000 Series of digital and mixed signal oscilloscopes to include modelling of on-chip silicon behaviour using IBIS-AMI models and S-parameters. According to the company, this improves the correlation between measurement and simulation for faster, more accurate characterisation of on-chip silicon behaviour and performance for today's mobile, enterprise and data communication standards.

As serial data rates increase, most next generation serial technologies require measurements at the far end where the eye is completely closed. Equalisation must be done to open the eye before the measurements can be taken. Until now, reference equalisers based on a mathematical model have been used for compliance testing, but these equalisers lack correlation with simulators and fail to represent complex real-world silicon behaviour. In contrast, IBIS-AMI models are designed using the architecture of the actual receiver silicon.

Support for IBIS-AMI is included as part of the Serial Data Link Analysis Visualiser (SDLA Visualiser) package that provides a complete solution for de-embedding the effects of cables, fixtures and probes for silicon validation, system verification, backplane characterisation and embedded system performance. SDLA Visualiser also supports "what-if" channel analysis through simulating transmitter equalisation and S-parameter scaling, enabling designers to predict system performance without the need for a physical channel model.

A significant advantage to using IBIS-AMI models is correlation with simulation results and confidence that the resulting measurements match system behaviour. The SDLA Visualizer for Tektronix MSO/DPO70000 oscilloscopes is available worldwide and can be purchased for $11,000 MSRP.

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