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Low-jitter clock module touts wide test coverage

Posted: 11 Jul 2012     Print Version  Bookmark and Share

Keywords:test  clock  module 

Advantest Corp. introduces the T2000 LJC16, a 16-channel, low-jitter-clock module that combines different digital clock and analogue clock/sine-wave requirements in a single high-multi-site system.

Today's digital and analogue ICs offer faster I/O speeds, and testing them needs more stringent clock requirements. To get the highest manufacturing yields, testing advanced semiconductors requires the ability to source low jitter below 500femto-seconds; deliver gigahertz clocking speeds; provide programmable duty cycles; and offer the highest performance sine wave inputs to ADCs.

The LJC16 module claims to enable customers to perform all necessary tests on one tool without needing multiple modules, thus, saving on capital expenses and reducing cycle times while enabling greater test coverage.

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