Global Sources
EE Times-India
Stay in touch with EE Times India
EE Times-India > Embedded

fT-Ic measurement using Agilent B2900A

Posted: 16 Jun 2011     Print Version  Bookmark and Share

Keywords:source/measure units  network analyser 

The Agilent B2900A Series of source/measure units is capable of supplying the DC voltages and currents to a bipolar transistor in conjunction with a network analyser.

The B2900A Series covers wide current and voltage measurement ranges (from 100 fA/100 nV to 10.5 A/210 V). It also has a 4-wire measurement function with remote-sensing that allows you to measure the IV characteristics of bipolar transistors accurately through a bias-T by eliminating the influence of the residual resistance.

View the PDF document for more information.

Comment on "fT-Ic measurement using Agilent B290..."
*  You can enter [0] more charecters.
*Verify code:


Visit Asia Webinars to learn about the latest in technology and get practical design tips.


Go to top             Connect on Facebook      Follow us on Twitter      Follow us on Orkut

Back to Top