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Software environment for automated DC/CV, RF measurements in IC-CAP

Posted: 18 Jan 2011     Print Version  Bookmark and Share

Keywords:DC/CV  Automated measurement software  thermal chucks 

Accurate DC/CV (and RF) statistical modeling of CMOS devices requires collecting a significant amount of measured data from different wafers across several temperatures. DC and RF device modeling teams must adopt a modeling flow that includes a sophisticated automated measurement solution and efficient data handling capabilities to support advanced statistical analysis and modeling. Automated measurement software must combine the ability to drive probers, switching matrixes and thermal chucks according to a predefined wafer map, with the ability to run complex DC/CV and RF measurements using a variety of instruments—from parametric testers to single box instruments.

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