Global Sources
EE Times-India
EE Times-India > EDA/IP

Test data provides yield improvement metrics

Posted: 25 Sep 2008     Print Version  Bookmark and Share

Keywords:DFY  DFM  yield improvement  test data 

Design-for-yield (DFY) tools are expected to improve product yield. Design-for-manufacturing (DFM) tools are expected to prevent yield loss. Speculation of the value of DFM or DFY technology can be easily delineated by simply validating simulated or predicted results using test data from wafer probe. In the absence of measured silicon, the credibility of the DFM or DFY tools is challenged. Therefore a common definition of product yield improvement metrics that are understood by test, manufacturing, design, and product engineers is the first step in design tools predicting product yield improvement.

View the PDF document for more information.

Comment on "Test data provides yield improvement..."
*  You can enter [0] more charecters.
*Verify code:


Visit Asia Webinars to learn about the latest in technology and get practical design tips.


Go to top             Connect on Facebook      Follow us on Twitter      Follow us on Orkut

Back to Top