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Agilent signs agreement with CWS for test solutions

Posted: 08 Dec 2006     Print Version  Bookmark and Share

Keywords:test solutions  long-term reliability  semiconductor  IC  Agilent Technologies 

Agilent Technologies Inc. announced a formal agreement with Core Wafer Systems (CWS), a provider of accelerated and long-term reliability test solutions and analysis tools for the semiconductor test market space.

As part of the agreement, Agilent offers CWS software reliability solutions, services and test structure libraries, which are uniquely compatible with Agilent hardware. The company will also sell a turnkey solution and support the integrated software and hardware as a single source vendor for reliability customers.

"CWS' software reliability test solutions are a natural extension to the reliability solutions already supported by the Agilent B1500A Semiconductor Device Analyser and the Agilent 4070 series of parametric testers," said Minoru Ebihara, vice president and general manager of Agilent Hachioji semiconductor test division. "Now we can offer a complete range of semiconductor reliability test solutions, from instruments to systems, and the modular nature of our approach makes it easy and cost-effective for our customers to start small and add later to their reliability test capabilities as their needs change."

"This alliance with Agilent will allow us to further expand our reach to the worldwide customer base. Now all customers will have convenient access to these advanced tools, which will help them increase efficiency and lower their overall cost-of-test at the deep nanometer scale," said Roger Goetz, CEO of CWS.

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