Global Sources
EE Times-India
Stay in touch with EE Times India
EE Times-India > RF/Microwave

Advanced test ensures system longevity

Posted: 16 Oct 2003     Print Version  Bookmark and Share

Keywords:w-cdma  test control protocol  3gpp  rmc  rf 

Leveraging the hooks built into the W-CDMA requires a full understanding of how they work and the trade-offs involved in their use.

View the PDF document for more information.

Comment on "Advanced test ensures system longevi..."
*  You can enter [0] more charecters.
*Verify code:


Visit Asia Webinars to learn about the latest in technology and get practical design tips.


Go to top             Connect on Facebook      Follow us on Twitter      Follow us on Orkut

Back to Top