Global Sources
EE Times-India
Stay in touch with EE Times India
 
EE Times-India > Manufacturing/Packaging
 
 
Manufacturing/Packaging  

Fast testers now tackle wireless handsets

Posted: 16 Sep 2005     Print Version  Bookmark and Share

Keywords:anritsu  test instrumentation  device under test  wideband cdma  umts 

Here's a new-generation test solution that uses. advanced hardware and software for quick and accurate measurements in a variety of handsets

View the PDF document for more information.



Comment on "Fast testers now tackle wireless han..."
Comments:  
*  You can enter [0] more charecters.
*Verify code:
 
 
Webinars

Seminars

Visit Asia Webinars to learn about the latest in technology and get practical design tips.

 

Go to top             Connect on Facebook      Follow us on Twitter      Follow us on Orkut

 
Back to Top