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Functional safety poses problems for semiconductor design

Posted: 16 May 2011     Print Version  Bookmark and Share

Keywords:random failures  functional safety techniques  IEC 61508  ISO 26262 

To manage systematic and random failures, vendors have applied functional safety techniques at the system level for decades. As the capability to integrate multiple system-level functions into a single component has increased, there's been a desire to apply those same practices at the semiconductor component or even subcomponent level.

Although the state of the art in functional safety is not yet well aligned with the state of the art in semiconductors, recent work on the IEC 61508 second edition and ISO 26262 draft standards have brought improvements. Many challenges remain, however.

View the PDF document for more information.





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