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Discover the benefits of auto ramp and scan functions

Posted: 12 Jul 2010     Print Version  Bookmark and Share

Keywords:U3606A auto ramp  scan function U3606A  benefits scan functions 

In many general purpose test and measurement applications, engineers often use a power supply to provide power to devices and use a digital multi-meter (DMM) for voltage or current measurements. The engineers also need to perform instrument programming when dealing with sweep voltage/current signals. In this application note, you will discover the advantages of using U3606A's auto ramp and scan features in performing multi-level DC test from the front panel, without any programming required for reliability test and power on/off test. Towards the end of this document, you will also learn how to use the front panel interface to create and store a completed ramp and scan DC bias method.

View the PDF document for more information.





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