Global Sources
EE Times-India
Stay in touch with EE Times India
 
EE Times-India > Amplifiers/Converters
 
 
Amplifiers/Converters  

X-ray effects on Intersil FGA references

Posted: 23 Jun 2010     Print Version  Bookmark and Share

Keywords:X-ray radiation  PCB post assembly  medical X-ray 

The floating gate capacitor is susceptible to radiation degradation from various particles and photons in excessive doses, as the electrons generated in the silicon dioxide are collected in the storage cell. Normal radiation from cosmic rays or radon, which exist in small amounts on earth will not cause the FGA reference voltage to drift appreciably for over 100 years. Artificial sources of radiation such as X-ray machines are capable of high enough doses to cause output voltage shift. Note that flash memory devices are also susceptible to X-ray radiation degradation, although to a lesser degree as they are not precision analogue devices.

Specific threats for X-ray radiation include PCB post-assembly inspection and airport luggage screening. Lesser threats include medical X-ray machines and airport carry-on X-ray.

View the PDF document for more information.





Comment on "X-ray effects on Intersil FGA refere..."
Comments:  
*  You can enter [0] more charecters.
*Verify code:
 
 
Webinars

Seminars

Visit Asia Webinars to learn about the latest in technology and get practical design tips.

 

Go to top             Connect on Facebook      Follow us on Twitter      Follow us on Orkut

 
Back to Top