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Network analyser adds 13.5, 43.5, 50 GHz models

Posted: 09 Jun 2009     Print Version  Bookmark and Share

Keywords:network analyser  wireless communications  test stations  wafer test 

PNA-X network analyser

Agilent Technologies Inc. has expanded its PNA-X network analyser with 13.5, 43.5 and 50 GHz models.

The 43.5 and 50 GHz models support higher frequency applications such as radar and satellite communications, while the 13.5 GHz model is ideal for lower-frequency devices used in wireless communications.

Agilent's PNA-X non-linear vector network analyser (NVNA) has also been expanded to include a 13.5 GHz model and the industry's first 43.5 and 50 GHz NVNA. These new solutions provide engineers developing and manufacturing active devices the flexibility to select just the right frequency that is required for their specific application.

Aerospace and defence engineers working up to 50 GHz can now benefit from Agilent's single-connection, multiple measurements PNA-X. This analyser's integrated measurements, versatile hardware, and re-configurable measurement paths address this market's key challenges: test system costs, test complexity, throughput gains, accuracy and equipment space. Typical radar, satellite and electronic-warfare applications require complex test systems with multiple racks of instruments and numerous connections to the device under test. The PNA-X integrates the capabilities of a full rack of equipment into a single instrument, simplifying test stations, reducing equipment count by 50 per cent, and increasing throughput by 400 per cent.

The PNA-X also offers a unique single contact solution for on wafer tests. This approach significantly improves quality by eliminating multiple probe contacts and enabling the most accurate characterisation and reliable wire-bonding. Additionally, engineers working above 50 GHz can use the PNA-X to configure a banded mm-wave system up to 0.5 THz.

The 13.5-GHz PNA-X model supports lower frequency devices used in the wireless communications market where reduced test time, number of test stations and test cost is critical. With low-noise amplifier tests there are typically multiple test stations, such as small signal gain/match, distortions, and noise figure; the PNA-X integrates these test stations into one. By integrating measurements from multiple test stations into one, the PNA-X reduces the number of test stations by as much as 75 per cent and reduces costs by 30 per cent.

The industry's first 43.5 and 50 GHz NVNAs and new 13.5 GHz model now bring the NVNA solution to engineers working in the RF and microwave frequency ranges. Agilent's NVNA is the industry's first measurement and simulation environment for designing non-linear components. The result is the highest level of insight into non-linear device behaviour, making the NVNA capability especially useful for scientists researching new RF technologies and engineers involved in designing today's high-performance active devices.

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