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Automated test solution targets USB 3.0 devices

Posted: 26 May 2009     Print Version  Bookmark and Share

Keywords:TekExpress  Superspeed USB  oscilloscope  signal fidelity 

Tektronix, Inc. has introduced a new comprehensive toolset for characterisation, debug and automated compliance test of Superspeed USB (USB 3.0) devices.

The new option USB-TX with the DPO/DSA70000B Oscilloscope provides an automated one-button solution to validate USB 3.0 transmitter devices – enabling engineers a more efficient way to bring their designs to market. The company also introduced a full set of USB 3.0 test fixtures that enable engineers to perform more accurate transmitter, receiver, and cable testing.

Driven by the continuous need for faster data transmissions, the 10x performance improvement over current USB solutions provided by USB 3.0 creates multiple challenges for system and circuit designers. The increased bandwidth brings with it critical signal transmission and signal fidelity challenges that require highly accurate and versatile test solutions. While other industry offerings provide only normative measurements per the USB -IF electrical test specification, the Tektronix option USB -TX supports all measurements including normative and informative tests – Spread Spectrum Clocking (SSC), Slew, Voltage Levels and others. This enables customers to have full confidence in their design validation process.

Option USB -TX is built on TekExpress framework which has been developed for automated one-button testing of high speed serial data standards. TekExpress modules are based on the test requirements and Methods of Implementation (MOI) specified and published by the standard bodies. All tests procedures are automated and customers simply need to select the desired tests to obtain a comprehensive report with pass/fail and margin results.

U.S. list price for option USB -TX based on the TekExpress framework is Rs.2.53 lakh ($5000) and can be ordered immediately. Test fixtures will be available in the summer 2009.





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