Global Sources
EE Times-India
Stay in touch with EE Times India
 
EE Times-India > Embedded
 
 
Embedded  

NIST scientists create ion-trap junctions

Posted: 16 Apr 2009     Print Version  Bookmark and Share

Keywords:quantum computer  ion trap  data storage  quantum processor 

National Institute of Standards and Technology (NIST) physicists have demonstrated a new ion trap that enables ions to go through an intersection while keeping their cool. Ten million times cooler than in prior similar trips, in fact.

The demonstration is a step towards scaling up trap technology to build a large-scale quantum computer using ions (electrically charged atoms), a potentially powerful machine that could perform certain calculations—such as breaking today's best data encryption codes—much faster than today's computers.

NIST's new trap with a junction solves a key engineering issue for future possible ion-trap quantum computers: how to move ions in a particular quantum mechanical state back and forth between different locations for data storage or logic operations, without heating them up so much that they lose their fragile quantum properties, which are critical to information processing.

NIST X-trap

NIST X-trap (Click to view full image)

The new ion trap, a rectangle roughly 5 by 2 millimeters in outer dimensions, was constructed from laser-machined alumina, with a gold coating to form electrodes. It is more complex than previous NIST ion traps, with 46 electrodes supporting 18 ion trapping zones. Its unique feature is an X-shaped bridge connecting electrodes across a junction between zones. Junctions are required to allow ions to be grouped together efficiently for logic operations. As voltages are applied to different electrodes to move the ions, the electric fields restrain an ion as it moves between trapping zones. The fields created by the X-bridge are required for smooth transport through the junction and to keep ions from popping out at the junction.

NIST scientists transported single beryllium ions through the X-junction more than one million times while maintaining the properties critical to information processing with greater than 99.99 per cent success. Pairs of ions were transported over 100,000 times. Ion transport through a junction has been reported once before, but the ions in the NIST trap received over ten million times less heat than the earlier effort. The low heating, achieved through careful control and reductions in electrical noise, minimises a major source of computation errors and processing slowdowns.

1 • 2 Next Page Last Page



Comment on "NIST scientists create ion-trap junc..."
Comments:  
*  You can enter [0] more charecters.
*Verify code:
 
 
Webinars

Seminars

Visit Asia Webinars to learn about the latest in technology and get practical design tips.

 

Go to top             Connect on Facebook      Follow us on Twitter      Follow us on Orkut

 
Back to Top