Global Sources
EE Times-India
Stay in touch with EE Times India
 
EE Times-India > T&M
 
 
T&M  

Optimise RF/microwave test system's elements

Posted: 05 Mar 2009     Print Version  Bookmark and Share

Keywords:device under test  RF/microwave test systems 

This application note by Agilent offers ideas and suggestions that can help you create flexible, long-lived RF/microwave test systems that will provide accurate, repeatable assessments of the device under test (DUT). Our focus is on making it easier for you to configure, update and modify your systems now and in the future.

When discussing the future-proofing of a test system, it's important to clarify what "future" means within the context of the DUT and its expected lifetime. For RF/microwave test systems, there are two large classes of DUTs that have specific future requirements.

When it's time to define and assemble the test system, two major items will affect your decisions about test equipment: the key attributes of the DUT and the various constraints on the test system. A quick review of important attributes and constraints will lay a foundation for the discussions in this document.

View the PDF document for more information.





Comment on "Optimise RF/microwave test system's ..."
Comments:  
*  You can enter [0] more charecters.
*Verify code:
 
 
Webinars

Seminars

Visit Asia Webinars to learn about the latest in technology and get practical design tips.

 

Go to top             Connect on Facebook      Follow us on Twitter      Follow us on Orkut

 
Back to Top