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Test methods identify small delay defects

Posted: 30 Oct 2006     Print Version  Bookmark and Share

Keywords:test quality  DFT  ATPG  at-speed testing 

Today's small delay defects are not only decreasing yields, but are also increasing the number of test escapes shipped out. Now, design for test (DFT) and test engineers have to find out how to improve test quality without dramatically increasing the cost of test.

Now at 90nm and below, more advanced DFT-based at-speed testing is needed to improve on the DPPM goals achieved at 130nm. This article presents a revolutionary approach in ATPG technology to improve at-speed testing.

View the PDF document for more information.





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