Global Sources
EE Times-India
Stay in touch with EE Times India
 
EE Times-India > Embedded
 
 
Embedded  

JTAG breaks barrier between structural and functional testing

Posted: 19 Jun 2008     Print Version  Bookmark and Share

Keywords:boundary-scan controllers  test coverage  functional validation  RMI 

JT 37x7 / RMI

JTAG released a new line of boundary-scan controllers that allow combination of boundary-scan performance and test coverage with functional validation. It is now a simple matter for electronics manufacturers to combine boundary-scan performance and test coverage with functional validation with the announcement of the newest member of the high-performance DataBlaster line of boundary-scan controllers.

The new JT 37x7 / RMI (rack-mounted instrument) is conveniently packaged in a standard 19-inch by 1U form factor for compatibility with virtually any rack-mounted functional test system. The RMI supports all boundary-scan test applications including IEEE 1149.6 advanced digital network testing as well as in-system programming (ISP) of flash memories and programmable logic devices. With its four fully-compliant boundary-scan test access ports (TAPs), the RMI delivers excellent signal integrity at the target. In addition, the RMI provides 256 programmable I/Os to further enhance test coverage.

TAPs and I/Os are available on the front panel of the unit, and the TAPs can be combined for test purposes or ganged for high-throughput testing and ISP. The TAPs can also be extended via flat cables from the front panel to satisfy special fixturing requirements. I/O channels are individually programmable as input, output, bi-directional or tri-state, and voltage thresholds can be programmed to 1.5-, 1.8-, 2.5- or 3.3V for use with modern low-voltage logic families. To reduce scan chain length and improve test efficiency, any number of 16-channel groups can be bypassed.

The RMI is powered from the host computer and interfaces to the computer via three standard formats, USB 2.0, Ethernet 10/100 and IEEE 1394 Firewire, giving it nearly universal applicability and ease-of-use. Test clock frequency is programmable up to 40MHz allowing very rapid application execution, especially important for flash programming, while TAP voltages can be set for a wide range of input and output characteristics.

The RMI meets the need to combine boundary-scan operations with functional attesting perfectly-it's platform-neutral, equally at home in PXI-, VXI- or PCIbased test environments. And, because the RMI is completely self-contained with no auxiliary units, it is easily moved between test stations. Furthermore, in addition to rack-mounted test setups, the RMI is ideal for benchtop applications.

The new controller is fully compatible with all JTAG Technologies' development tools such as JTAG ProVisionTM and JTAG Visualiser. In combination with functional testing, the RMI works seamlessly with the industry's most popular architectures including National Instruments LabVIEW, LabWindows and TestStand as well as custom C/C++ and Visual Basic test systems.





Comment on "JTAG breaks barrier between structur..."
Comments:  
*  You can enter [0] more charecters.
*Verify code:
 
 
Webinars

Seminars

Visit Asia Webinars to learn about the latest in technology and get practical design tips.

 

Go to top             Connect on Facebook      Follow us on Twitter      Follow us on Orkut

 
Back to Top