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Test systems speed semiconductor characterisation

Posted: 15 Jun 2007     Print Version  Bookmark and Share

Keywords:automated test suite  semiconductor characterisation  controller  display drivers 

Keithley Instruments Inc. has announced the availability of the Automated Characterisation Suite (ACS) integrated test systems that provide faster measurements and greater system flexibility under one uniform software suite to fit unique test application needs. ACS test systems are suitable for semiconductor characterisation at the device, wafer and cassette level.

Under the unified Automated Characterisation Suite, Keithley's ACS integrated test systems incorporate a variety of test hardware and overall unique measurement capability:

?Keithley's Model 4200-SCS Semiconductor Characterisation System features I-V source-measure and specialised pulse testing packages, such as the Model 4200-PIV package for testing of advanced semiconductor materials.
?Series 2600 SourceMeter Instruments feature TSP-Link and Test Script Processor (TSP) for scalable I-V channel count systems, fast parallel measurements and complex test sequences for applications such as on-the-fly NBTI or on-wafer component characterisation.
?Series 2400 SourceMeter Instruments feature high voltage and high current sourcing, which are unique in applications such as high power MOSFETs and display drivers.
?Optional switching, C-meters and pulse generators round out the instrument capabilities of ACS integrated test systems.

ACS integrated test systems are available in basic bench-top configurations or in factory-integrated full-height rack configurations, said the company.

Keithley's new ACS systems are ideal for semiconductor parametric characterisation in R&D, technology development, quality/reliability assurance and small-scale production test.

Advance testing solution
At the wafer level, Keithley's ACS integrated test systems feature a Wafer Description Utility and wafer map. Users can easily build wafer description files with integrated test plans. Colour-coded wafer maps are updated in real-time during test execution to show pass/fail metrics, providing clear visibility into test results and assuring that test outcomes will be productive.

Another innovation is an interactive prober controller. This allows users to control wafer movement using the ACS software during test development to validate test setups on actual structures and during lot disposition to navigate to a problem area of the wafer and execute testing manually. A full range of drivers offers seamless integration with a range of semiautomatic and fully automatic probers.

Keithley's ACS integrated test systems are configured and integrated with Keithley's semiconductor applications expertise and customisation capability. This includes test routines such as macros, scripts and custom GUIs in addition to interconnects, including cables, switching, probe card adaptation, as well as installation, training and applications services.

Pricing for Keithley's ACS integrated test systems is based on the particular configuration and customisation options. The devices are available immediately.




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