Global Sources
EE Times-India
Stay in touch with EE Times India
 
EE Times-India > Embedded
 
 
Embedded  

STARC to use Mentor's analyser tool in DFM flow

Posted: 29 Jan 2007     Print Version  Bookmark and Share

Keywords:Mentor Graphics  analyser 

Research consortium Semiconductor Technology Academic Research Centre (STARC) will standardise on Mentor Graphics Corp.'s Calibre YieldAnalyser for critical area analysis (CAA) in their DFM flow. STARC will use Calibre YieldAnalyser's CAA tool to develop yield-aware design methodology as a part of its STARCAD-CEL (One step ahead of DFM) project.

The move to 90nm and 65nm nodes is increasing manufacturing cost. To solve this, STARC aims to use Mentor's CAA tool to achieve robust design patterns with its capacity for yield prediction prior to manufacturing accomplished by accurate extraction of CAA data from the layout and application of an optimised model that considers different yield densities for each process.

"From evaluation results, we have found that Calibre YieldAnalyser delivers highly accurate critical area extraction," said Nobuyuki Nishiguchi, vice president and general manager, Development Dept.-1 at STARC. "We are going to use this tool not only for critical area extraction and yield prediction, but also as a reference tool to enable more effective design enhancement."

"We are pleased that Calibre YieldAnalyser achieves STARC's requirements for highly accurate CAA extraction. We look forward to jointly delivering an effective solution to our mutual customers through the adoption of Calibre YieldAnalyser," said Patrick Williams, corporate VP, Mentor Graphics Japan.




Comment on "STARC to use Mentor's analyser tool ..."
Comments:  
*  You can enter [0] more charecters.
*Verify code:
 
 
Webinars

Seminars

Visit Asia Webinars to learn about the latest in technology and get practical design tips.

 

Go to top             Connect on Facebook      Follow us on Twitter      Follow us on Orkut

 
Back to Top