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Aluminum channel profile analysis and conducting polymer surface characterization

Posted: 12 Sep 2001     Print Version  Bookmark and Share

Keywords:burleigh  afm  microscope  aluminum  polymer 

This application note discusses AFM (Atomic Force Microscopy) as a powerful high-resolution imaging technique for examining microstructures on aluminum substrate and conductive gratings in conducting polymer films.

View the PDF document for more information.



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