Global Sources
EE Times-India
Stay in touch with EE Times India
 
EE Times-India > Manufacturing/Packaging
 
 
Manufacturing/Packaging  

Simulation engine reduces fab cycle times

Posted: 17 Feb 2003     Print Version  Bookmark and Share

Keywords:virtual stepper  umc  numerical  defect  mask engineering 

With an aim to strengthen the links with its suppliers and streamline its photomask operations, UMC collaborated with Numerical Technologies to define a simulation-based mask defect qualification methodology.

View the PDF document for more information.



Comment on "Simulation engine reduces fab cycle ..."
Comments:  
*  You can enter [0] more charecters.
*Verify code:
 
 
Webinars

Seminars

Visit Asia Webinars to learn about the latest in technology and get practical design tips.

 

Go to top             Connect on Facebook      Follow us on Twitter      Follow us on Orkut

 
Back to Top